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integrated reliability test

См. также в других словарях:

  • Reliability engineering — is an engineering field, that deals with the study of reliability: the ability of a system or component to perform its required functions under stated conditions for a specified period of time. [ Definition by IEEE] It is often reported in terms… …   Wikipedia

  • Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

  • Integrated Logistics Support — (ILS) is a technique introduced by the US Army to ensure that the supportability of an equipment is considered during its design and development. The technique was adopted by the UK MOD in 1993 and made compulsory for the procurement of the… …   Wikipedia

  • Integrated circuit — Silicon chip redirects here. For the electronics magazine, see Silicon Chip. Integrated circuit from an EPROM memory microchip showing the memory blocks, the supporting circuitry and the fine silver wires which connect the integrated circuit die… …   Wikipedia

  • Integrated circuit design — Layout view of a simple CMOS Operational Amplifier ( inputs are to the left and the compensation capacitor is to the right ). The metal layers are colored blue and green, the polysilicon is red and vias are crosses. Integrated circuit design, or… …   Wikipedia

  • Integrated powerhead demonstrator — The Integrated powerhead demonstrator (IPD) is a U.S. Air Force project run by NASA and the AFRL to develop a rocket engine that utilizes a full flow staged combustion cycle (FFSCC). The prime contractors are Rocketdyne and Aerojet. [] The main… …   Wikipedia

  • Test automation — Compare with Manual testing. Test automation is the use of software to control the execution of tests, the comparison of actual outcomes to predicted outcomes, the setting up of test preconditions, and other test control and test reporting… …   Wikipedia

  • Three-dimensional integrated circuit — In electronics, a three dimensional integrated circuit (3D IC, 3D IC, or 3 D IC) is a chip in which two or more layers of active electronic components are integrated both vertically and horizontally into a single circuit. The semiconductor… …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • Pearson's chi-squared test — (χ2) is the best known of several chi squared tests – statistical procedures whose results are evaluated by reference to the chi squared distribution. Its properties were first investigated by Karl Pearson in 1900.[1] In contexts where it is… …   Wikipedia

  • IRTP — abbr. comp. Internet Reliable Transaction Protocol tech. Integrated Reliability Test Program …   Dictionary of English abbreviation

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